PAPERS |
Kazuyoshi NEZU, Yasukazu FUJII, Shunichi KUSUMI,
Takahiro FUKUTANI, Atsushi IWAINAKA
This paper proposes a method to estimate an arc generation status, using a measuring data of current type contact loss measurement. For evaluating the effect of contact loss arc on contact strip wear, optical type contact loss measurement to detect arc emission is necessary. However, it can be measured only in nighttime because of a sunlight incident. So we developed a method to estimate an arc generation status with the circuit simulation using a result of current type contact loss measurement which can be executed all day.
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